15 Mar 2012|Noida | Amity University Campus, Sector - 125 Noida
Dr. Tan Cher Ming, Nanyang Technological University, Singapore delivers lecture at Amity School of Engineering and Technology
Dr. Tan Cher Ming, Nanyang Technological University, Singapore delivered lecture on the topic "Physics of Electromigration in Today ULSI Interconnection" at Amity School of Engineering and Technology.
Professor Ming stressed in his lecture that the Electromigration has been and will continue be an important reliability issue for ULSI. With the advanced in technology node in integrated circuit technology, the physics of electromigration has changed, and electron wind force is no longer the sole driving force, and also the commonly used Black Equation is shown to be inaccurate. In his talk, the basic physics of electromigration was presented, and the impact of electromigration to circuit performances was shown. The changing driving forces in electromigration was shown using both experimental and modeling approach. The Black’s equation for the prediction of the electromigration lifetime was revisited, and it was shown to be invalid experimentally. The alternative model to describe the lifetime of interconnection due to electromigration was presented. With this change in the physics of electromigration, the commonly employed electromigration aware design methodology was challenged and new method that employed 3D circuit model was shown, and the effect of electromigration on the basic building blocks for analog circuit, digital circuit and RFIC was presented.
Dr. Tan Cher Ming is also the General Chair of IEEE International Conference on Nanoelectronics 2008, General Co-Chair of International Symposium of Integrated Circuits 2007 and 2009, Founding Chair of IEEE International Conference on Emerging Technologies – Nanoelectronics. He is also the Guest Editor of International J. of Nanotechnology. He is in the reviewer board of several International Journals such as Thin Solid Film, Microelectronic Reliability, Microelectronic Engineering etc. He is presently the co-author of 5 books and book chapters. He is also the Chief Editor of a statistical optimization book entitled Stimulated Annealing to be published by ARS publishing Co. in 2008